Assessing the Environment with X-ray Fluorescence Spectrometry

In this paper we will introduce the general benefits of X-Ray Fluorescence spectrometry (XRF) for assessing the condition of the outer environment, especially where ambient aerosol particles are causing environmental disturbances. Examples from recent environmental studies are presented, and energy dispersive XRF is concluded to be a powerful, nondestructive yet easily applicable tool to supply detailed elemental information of particles collected in different applications. The further development and future potential of the method for detailed analysis of aerosol particles are discussed. INTRODUCTION Trace elements are essential for the environment and for human health, but at the same time inappropriate concentrations of the elements can cause considerable harm. To study the distribution of trace elements in the environment, to determine reasons for concentration changes and to estimate the possible consequences on the environment are challenging tasks for researchers of many research disciplines. The multi-element detection capacity, flexibility and low detection limits make the X-ray fluorescence technique (XRF) an excellent tool for the study of the elemental composition of environmental samples. Many different X-ray fluorescence techniques can be utilized in environmental studies. They all share the benefits of being able to perform the analysis on trace levels in minute samples. In one end of the spectrum we have large scale facilities used to study small scale samples, i.e. synchrotrons around the world with beam lines devoted to micro-XRF studies. The Advanced Light Source team (ASL, 2005) in Berkeley, CA, USA lists over 40 synchrotron facilities worldwide. The synchrotrons with their high brilliance and collimated beams are well suited for analysis of samples where high spatial resolution is needed (Carvalho et al., 2007; Goldberg et al., 2007; Li et al., 2007), for image mapping of samples (Endo et al., 2008) and Total reflection X-Ray Fluorescence (TXRF) analysis of minute samples (Fittschen et al., 2008). At the Diamond 265 Copyright ©JCPDS-International Centre for Diffraction Data 2011 ISSN 1097-0002 6